Archivio Istituzionale della RicercaThis paper deals with the control by design of digital integrated circuits conducted emission. In particular, it describes a technique to correlate the conducted emission of a digital integrated circuit (IC) with the power supply currents absorbed by its building blocks. Such a correlation allows one to derive the maximum allowable limits of current spectra at chip level in order to fulfill IC-conducted emission specifications.
Investigations on the correlations between IC conducted emission and chip-level power supply current / Fiori, Franco; Musolino, Francesco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 47:1(2005), pp. 28-33. [10.1109/TEMC.2004.842203]
Investigations on the correlations between IC conducted emission and chip-level power supply current
FIORI, Franco;MUSOLINO, FRANCESCO
2005
Abstract
This paper deals with the control by design of digital integrated circuits conducted emission. In particular, it describes a technique to correlate the conducted emission of a digital integrated circuit (IC) with the power supply currents absorbed by its building blocks. Such a correlation allows one to derive the maximum allowable limits of current spectra at chip level in order to fulfill IC-conducted emission specifications.
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https://hdl.handle.net/11583/1400078
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