Archivio Istituzionale della RicercaA scattering-state approach is proposed to study the propagation of extremely short optical pulses through semiconductor heterostructures. The formalism is applied to the propagation of exciton-polaritons: Our simulated experiments predict the formation of an exciton-induced polarization grating when the light pulse is resonant with the excitonic transition, and suggest proper physical conditions for its experimental detection. The grating is found to drift backward with respect to the light propagation direction.
Polarization grating in semiconductor films induced by exciton-polaritons / Kavokin, A. V.; Malpuech, G.; DI CARLO, A.; Lugli, P.; Rossi, Fausto. - In: PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH. - ISSN 0031-8965. - STAMPA. - 178:1(2000), pp. 581-585. [10.1002/1521-396X(200003)178:1<581::AID-PSSA581>3.0.CO;2-I]
Polarization grating in semiconductor films induced by exciton-polaritons
ROSSI, FAUSTO
2000
Abstract
A scattering-state approach is proposed to study the propagation of extremely short optical pulses through semiconductor heterostructures. The formalism is applied to the propagation of exciton-polaritons: Our simulated experiments predict the formation of an exciton-induced polarization grating when the light pulse is resonant with the excitonic transition, and suggest proper physical conditions for its experimental detection. The grating is found to drift backward with respect to the light propagation direction.
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https://hdl.handle.net/11583/1405225
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