This paper addresses the impact of device macromodels on the accuracy of signal integrity and performance predictions for critical digital interconnecting systems. It exploits nonlinear parametric models for both single-ended and differential devices, including the effects of power supply fluctuations and receiver bit detection. The analysis demonstrates that the use of well-designed macromodels dramatically speeds up the simulation as well it preserves timing accuracy even for long bit sequences.

Reliable Eye-Diagram Analysis of Data Links via Device Macromodels / Stievano, IGOR SIMONE; Maio, Ivano Adolfo; Canavero, Flavio; Siviero, Claudio. - In: IEEE TRANSACTIONS ON ADVANCED PACKAGING. - ISSN 1521-3323. - STAMPA. - 29:1(2006), pp. 31-38. [10.1109/TADVP.2005.862645]

Reliable Eye-Diagram Analysis of Data Links via Device Macromodels

STIEVANO, IGOR SIMONE;MAIO, Ivano Adolfo;CANAVERO, Flavio;SIVIERO, CLAUDIO
2006

Abstract

This paper addresses the impact of device macromodels on the accuracy of signal integrity and performance predictions for critical digital interconnecting systems. It exploits nonlinear parametric models for both single-ended and differential devices, including the effects of power supply fluctuations and receiver bit detection. The analysis demonstrates that the use of well-designed macromodels dramatically speeds up the simulation as well it preserves timing accuracy even for long bit sequences.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1406297
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