Archivio Istituzionale della RicercaA simple algorithm which unifies the calibration procedures for scattering and load pull measurements is proposed. The new technique is particularly useful when measuring non-insertable devices and for on-wafer characterizations. The algorithm was compared with other well established calibration techniques with very good results in terms of accuracy.
A unified calibration algorithm for scattering and load pull measurement / Pisani, Umberto; Ferrero, ANDREA PIERENRICO. - 2:(1996), pp. 1250-1253. (Intervento presentato al convegno IEEE Instrumentation and Measurement Technology Conference tenutosi a Brussels (BEL) nel 04-06 Jun 1996) [10.1109/IMTC.1996.507571].
A unified calibration algorithm for scattering and load pull measurement
PISANI, Umberto;FERRERO, ANDREA PIERENRICO
1996
Abstract
A simple algorithm which unifies the calibration procedures for scattering and load pull measurements is proposed. The new technique is particularly useful when measuring non-insertable devices and for on-wafer characterizations. The algorithm was compared with other well established calibration techniques with very good results in terms of accuracy.
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https://hdl.handle.net/11583/1416381
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