Archivio Istituzionale della RicercaA novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.
A complete measurement test-set for non-linear device characterization / Ferrero, ANDREA PIERENRICO; Teppati, Valeria. - STAMPA. - 40:(2001), pp. 1-3. (Intervento presentato al convegno IEEE ARFTG Conference tenutosi a San Diego, CA (USA) nel November 2001) [10.1109/ARFTG.2001.327494].
A complete measurement test-set for non-linear device characterization
FERRERO, ANDREA PIERENRICO;TEPPATI, VALERIA
2001
Abstract
A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.
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https://hdl.handle.net/11583/1418478
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