Archivio Istituzionale della RicercaChip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs.
Online self-repair of FIR filters / Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - STAMPA. - 20:3(2003), pp. 50-57. [10.1109/MDT.2003.1198686]
Online self-repair of FIR filters
BENSO, Alfredo;DI CARLO, STEFANO;DI NATALE, Giorgio;PRINETTO, Paolo Ernesto
2003
Abstract
Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs.
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https://hdl.handle.net/11583/1499804
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