Evolutionary Techniques for Minimizing Test Signals Application Time

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Item Type: Proceeding
MIUR type: Proceedings > Proceedings
Title: Evolutionary Techniques for Minimizing Test Signals Application Time
Authors string: Corno F; Sonza Reorda M; Squillero G.
University authors:
Page Range: pp. 183-189
Journal or Publication Title: LECTURE NOTES IN COMPUTER SCIENCE
Referee type: Not specified type
Publisher: Springer
ISBN: 9783540434320
ISSN: 0302-9743
Volume: 2279
Event Title: EvoWorkshops 2002: EvoCOP, EvoIASP, EvoSTIM/EvoPLAN
Event Location: Kinsale (IRL)
Event Dates: April 3–4, 2002
Abstract: Reducing production-test application time is a key problem for modern industries. Several different hardware solutions have been proposed in the literature to ease such process. However, each hardware architecture must be coupled with an effective test signals generation algorithm. This paper propose an evolutionary approach for minimizing the application time of a test set by opportunely extending it and exploiting a new hardware architecture, named interleaved scan. The peculiarities of the problem suggest the use of a slightly modified genetic algorithm with concurrent populations. Experimental results show the effectiveness of the approach against the traditional ones
Date: 2002
Status: Published
Language of publication:
Uncontrolled Keywords:
Departments (original): DAUIN - Control and Computer Engineering
Departments: DAUIN - Department of Control and Computer Engineering
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    Subjects: Area 09 - Ingegneria industriale e dell'informazione > SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI
    Date Deposited: 27 Mar 2007 13:03
    Last Modified: 24 Oct 2014 11:41
    Id Number (DOI): 10.1007/3-540-46004-7_19
    Permalink: http://porto.polito.it/id/eprint/1501667
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