Archivio Istituzionale della RicercaA powerful new technique is reported which enables realistic calculation of the optical energy gap of absorbing thin solid films by an analysis of measured transmittance and reflectance spectra in the fundamental absorption region. At the same time a new analytical method allows the thickness of films to be evaluated by measurements of transmittance only.
New approach to optical analysis of absorbing thin solid films / Demichelis, F; Kaniadakis, Giorgio; Tagliaferro, Alberto; Tresso, Elena Maria. - In: APPLIED OPTICS. - ISSN 0003-6935. - 26:9(1987), pp. 1737-1740. [10.1364/AO.26.001737]
New approach to optical analysis of absorbing thin solid films
KANIADAKIS, Giorgio;TAGLIAFERRO, Alberto;TRESSO, Elena Maria
1987
Abstract
A powerful new technique is reported which enables realistic calculation of the optical energy gap of absorbing thin solid films by an analysis of measured transmittance and reflectance spectra in the fundamental absorption region. At the same time a new analytical method allows the thickness of films to be evaluated by measurements of transmittance only.
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https://hdl.handle.net/11583/1658190
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