Archivio Istituzionale della RicercaA method able to reduce residual calibration uncer- tainty of real-time load-pull measurements, by means of error terms optimization, is proposed in this pa- per. It has been first tested with simulations, then it has been applied to real measurement data, proving a considerable uncertainty reduction.
Accuracy Improvement of on-wafer load-pull measurements / Ferrero, ANDREA PIERENRICO; Teppati, Valeria; D., Parena; Pisani, Umberto. - STAMPA. - (2006), pp. 278-279. (Intervento presentato al convegno IEEE Conference on Precision Eletromagnetic Measurements tenutosi a Torino nel 14-16 July).
Accuracy Improvement of on-wafer load-pull measurements
FERRERO, ANDREA PIERENRICO;TEPPATI, VALERIA;PISANI, Umberto
2006
Abstract
A method able to reduce residual calibration uncer- tainty of real-time load-pull measurements, by means of error terms optimization, is proposed in this pa- per. It has been first tested with simulations, then it has been applied to real measurement data, proving a considerable uncertainty reduction.
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https://hdl.handle.net/11583/1670108
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