We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a ∼ 10^2 near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations.

Near-field imaging of Bloch surfacewaves on silicon nitride one-dimensionalphotonic crystals / Descrovi, Emiliano; T., Sfez; L., Dominici; W., Nakagawa; F., Michelotti; Giorgis, Fabrizio; H., Herzig. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 16:(2008), pp. 5453-5464.

Near-field imaging of Bloch surfacewaves on silicon nitride one-dimensionalphotonic crystals

DESCROVI, EMILIANO;GIORGIS, FABRIZIO;
2008

Abstract

We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a ∼ 10^2 near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations.
2008
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1744121
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