Archivio Istituzionale della RicercaTesting communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.
Test Program Generation for Communication Peripherals in Processor-Based Systems-on-Chip / Apostolakis, A; Gizopoulos, D; Psarakis, M; Ravotto, Danilo; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - 26:2(2009), pp. 52-63. [10.1109/MDT.2009.43]
Test Program Generation for Communication Peripherals in Processor-Based Systems-on-Chip
RAVOTTO, DANILO;SONZA REORDA, Matteo
2009
Abstract
Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/1855299
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo