Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors

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Item Type: Proceeding
MIUR type: Proceedings > Proceedings
Title: Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors
Authors string: Bernardi P; Christou K; Grosso M.; Michael M; Sanchez E; Sonza Reorda M
University authors:
Page Range: pp. 224-234
Referee type: Not specified type
ISBN: 9783540787600
ISSN: 0302-9743
Volume: 4974
Event Title: European Workshops on the Theory and Applications of Evolutionary Computation, EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog
Event Location: Naples (IT)
Event Dates: March 26-28, 2008
Abstract: This paper presents an innovative approach for the generation of test programs detecting path-delay faults in microprocessors. The proposed method takes advantage of the multiobjective implementation of a previously devised evolutionary algorithm and exploits both gate- and RT-level descriptions of the processor: the former is used to build Binary Decision Diagrams (BDDs) for deriving fault excitation conditions; the latter is used for the automatic generation of test programs able to excite and propagate fault effects, based on a fast RTL simulation. Experiments on an 8-bit microcontroller show that the proposed method is able to generate suitable test programs more efficiently compared to existing approaches
Date: 2008
Status: Published
Language of publication: English
Uncontrolled Keywords:
Departments (original): DAUIN - Control and Computer Engineering
Departments: DAUIN - Department of Control and Computer Engineering
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    Subjects: Area 09 - Ingegneria industriale e dell'informazione > SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI
    Date Deposited: 13 Jan 2009 11:08
    Last modification data (IRIS): 09 Jul 2014 10:58:01
    Update date (PORTO): 27 Oct 2014 14:03
    Id Number (DOI): 10.1007/978-3-540-78761-7_23
    Permalink: http://porto.polito.it/id/eprint/1877353
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