The stimulated ignition of latchup effects caused by external radiation has so far proven to be a hidden hazard. Here this effect is described as a novel approach to detect particles by means of a solid-state device susceptible to latchup effects. In addition, the device can also be used as a circuit for reading sensors’ signals, leaving the capability of sensing to external sensors. As the MOS transistors are widely used at present in microelectronics devices and sensors, this latchup-based cell is proposed as a novel structure for future applications in particle detection, amplification of sensors’ signals and radiation monitoring.

Exploiting a Latchup Circuit via Commercial CMOS Technologies / Gabrielli, A; Demarchi, Danilo; Villani, G.. - ELETTRONICO. - 1:(2009), pp. 1198-1201. (Intervento presentato al convegno 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference tenutosi a Orlando, FL, USA nel 25-31 October 2009).

Exploiting a Latchup Circuit via Commercial CMOS Technologies

DEMARCHI, DANILO;
2009

Abstract

The stimulated ignition of latchup effects caused by external radiation has so far proven to be a hidden hazard. Here this effect is described as a novel approach to detect particles by means of a solid-state device susceptible to latchup effects. In addition, the device can also be used as a circuit for reading sensors’ signals, leaving the capability of sensing to external sensors. As the MOS transistors are widely used at present in microelectronics devices and sensors, this latchup-based cell is proposed as a novel structure for future applications in particle detection, amplification of sensors’ signals and radiation monitoring.
2009
9781424439621
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2262552
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