An accurate measurement method to extract the common mode (CM) and the differential mode (DM) noise source impedances of a switched mode power supply (SMPS) under its operating condition is developed and validated. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to design an electromagnetic interference (EMI) filter for a SMPS systematically with minimum hassle.

Accurate Extraction of Noise Source Impedance of an SMPS Under Operating Conditions / Tarateeraseth, V.; Bo, Hu; Kye Yak, See; Canavero, Flavio. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - STAMPA. - Vol. 25:1(2010), pp. 111-117. [10.1109/TPEL.2009.2024675]

Accurate Extraction of Noise Source Impedance of an SMPS Under Operating Conditions

CANAVERO, Flavio
2010

Abstract

An accurate measurement method to extract the common mode (CM) and the differential mode (DM) noise source impedances of a switched mode power supply (SMPS) under its operating condition is developed and validated. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to design an electromagnetic interference (EMI) filter for a SMPS systematically with minimum hassle.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2362053
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