Exploiting competing subpopulations for automatic generation of test sequences for digital circuits

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Item Type: Proceeding
MIUR type: Proceedings > Proceedings
Title: Exploiting competing subpopulations for automatic generation of test sequences for digital circuits
Authors string: Corno F., Prinetto P., Rebaudengo M., Sonza Reorda M.
University authors:
Page Range: pp. 791-800
Referee type: Not specified type
Publisher: Springer
ISBN: 354061723X
ISSN: 0302-9743
Volume: 1141
Event Title: International Conference on Evolutionary Computation — The 4th International Conference on Parallel Problem Solving from Nature
Event Location: Berlin (DEU)
Event Dates: September 22–26, 1996
Abstract: The paper describes the application of a Parallel Genetic Algorithm to Automatic Test Pattern Generation (ATPG) for digital circuits. Genetic Algorithms have been already proposed to solve this industrially critical problem, both on mono- and multi-processor architectures. Although preliminary results are very encouraging, there are some obstacles which limit their use: in particular, GAs are often unable to detect some hard to test faults, and require a careful tuning of the algorithm parameters. In this paper, we describe a new parallel version of an existing GA-based ATPG, which exploits competing sub-populations to overcome these problems. The new approach has been implemented in the PVM environment and has been evaluated on a workstation network using standard benchmark circuits. Preliminary results show that it is able to improve the results quality (by testing additional critical faults) at the expense of increased CPU time requirements
Date: 1996
Status: Published
Language of publication: English
Uncontrolled Keywords:
Departments (original): UNSPECIFIED
Departments: DAUIN - Department of Control and Computer Engineering
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    Date Deposited: 13 Oct 2010 23:19
    Last modification data (IRIS): 21 Jan 2013 14:38:13
    Update date (PORTO): 28 Oct 2014 12:57
    Id Number (DOI): 10.1007/3-540-61723-X_1042
    Permalink: http://porto.polito.it/id/eprint/2374693
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