Software-based self-test of embedded microprocessors

Transient faults became an increasing issue in the past few years as smaller geometries of newer, highly miniaturized, silicon manufacturing technologies brought to the mass-market failure mechanisms traditionally bound to niche markets as electronic equipments for avionic, space or nuclear applications. This chapter presents the origin of transient faults, it discusses the propagation mechanism, it outlines models devised to represent them and finally it discusses the state-of-the-art design techniques that can be used to detect and correct transient faults. The concepts of hardware, data and time redundancy are presented, and their implementations to cope with transient faults affecting storage elements, combinational logic and IP-cores (e.g., processor cores) typically found in a System-on-Chip are discussed.