Genetic Defect Based March Test Generation for SRAM

Item Type: Proceeding
MIUR type: Proceedings > Proceedings
Title: Genetic Defect Based March Test Generation for SRAM
Authors string: Di Carlo, S.; Politano, G.; Prinetto, P.; Savino, A.; Scionti, A.
University authors:
Page Range: pp. 141-150
Referee type: Scientific committee
Publisher: Springer
ISBN: 9783642205194
ISSN: 0302-9743
Volume: 6625
Event Title: EvoCOMNET, EvoFIN, EvoHOT, EvoMUSART, EvoSTIM, and EvoTRANSLOG, EvoApplications 2011
Event Location: Torino (IT)
Event Dates: April 27-29 2011
Abstract: The continuos shrinking of semiconductor's nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the effect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper pro- poses a new approach to automate this procedure exploiting a dedicated genetic algorithm
Date: 2011
Status: Published
Language of publication: English
Uncontrolled Keywords: digital system design test and verification, memory testing, march test generation, defect based testing
Departments (original): DAUIN - Control and Computer Engineering
Departments: DAUIN - Department of Control and Computer Engineering
Related URLs:
Subjects: Area 09 - Ingegneria industriale e dell'informazione > SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI
Date Deposited: 16 Sep 2016 19:44
Last modification data (IRIS): 20 Sep 2016 10:14:32
Update date (PORTO): 22 Sep 2016 20:20
Id Number (DOI): 10.1007/978-3-642-20520-0_15
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