Genetic Defect Based March Test Generation for SRAM

Item Type: Article
MIUR type: Article > Journal article
Title: Genetic Defect Based March Test Generation for SRAM
Authors string: Di Carlo S., Politano G., Prinetto P., Savino A., Scionti A.
University authors:
Journal or Publication Title: LECTURE NOTES IN COMPUTER SCIENCE
Referee type: Not specified type
Publisher: Springer
Volume: 6625
Page Range: pp. 141-150
Number of Pages: 10
ISSN: 0302-9743
Description/Info: The continuos shrinking of semiconductor's nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the effect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper pro- poses a new approach to automate this procedure exploiting a dedicated genetic algorithm
Date: 2011
Status: Published
Language of publication: English
Uncontrolled Keywords: digital system design test and verification, march test generation, defect based testing, memory testing
Departments (original): DAUIN - Control and Computer Engineering
Departments: DAUIN - Department of Control and Computer Engineering
Related URLs:
Subjects: Area 09 - Ingegneria industriale e dell'informazione > SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI
Date Deposited: 15 Mar 2011 14:03
Last Modified: 29 Nov 2012 03:02
Id Number (DOI): 10.1007/978-3-642-20520-0_15
Permalink: http://porto.polito.it/id/eprint/2387854
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