Archivio Istituzionale della RicercaThis paper addresses the deembedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waveguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method, that is applied to setups involving different launchers.
Complex Permittivity Determination from Measured Scattering Parameters of TEM Waveguides / Savi, P.; Niyazov, U.; Maio, I. A.. - ELETTRONICO. - (2011), pp. 1352-1355. (Intervento presentato al convegno International Conference on Electromagnetics in Advanced Applications (ICEAA 11) tenutosi a Torino nel September 12-16, 2011) [10.1109/ICEAA.2011.6046548].
Complex Permittivity Determination from Measured Scattering Parameters of TEM Waveguides
Savi, P.;Maio, I. A.
2011
Abstract
This paper addresses the deembedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waveguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method, that is applied to setups involving different launchers.
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https://hdl.handle.net/11583/2496742