A Binary Front-End Robust to EMI-Induced Errors

In the last decades, EMI issues have become a major concern in system reliability because of the continuous reduction of the supply voltage and the rapid growth of the EM pollution. In this context, the present paper proposes a new binary input frontend immune to failures that can be induced by EMI conveyed to the IC pad through PCB traces, leadframe and bonding wires. The receiver is able to retrieve the nominal logic value of the transmitted binary data corrupted by strong EM disturbances and to measure the strength of the EM disturbance that affects the binary input signal. The proposed binary frontend circuit is validated through computer simulations.