Load-pull experimental characterisation of active devices under non linear operation is a well proved technique still used in designing power amplifiers. When applied to the MMIC, this technique shall require special solutions to be extended to on-wafer devices up to millimetre waves. The paper presents an overview on the traditional load pull measurement techniques focusing the attention on millimetre wave application. An example of a fully automatic on-wafer system is described along with the more useful calibration techniques. By means of this test set a very detailed characterisation of devices can be carried out in short time, by setting the loads either at the fundamental or at the harmonic frequencies with independent controls.

Load pull techniques for millimetre-wave device characterization / Pisani, Umberto; Ferrero, ANDREA PIERENRICO; G. L., Madonna. - STAMPA. - (1998), pp. 27-32. (Intervento presentato al convegno GAAS, Gallium Arsenide Applications Symposium tenutosi a Amsterdam (The Netherlands) nel 5-6 October 1998).

Load pull techniques for millimetre-wave device characterization

PISANI, Umberto;FERRERO, ANDREA PIERENRICO;
1998

Abstract

Load-pull experimental characterisation of active devices under non linear operation is a well proved technique still used in designing power amplifiers. When applied to the MMIC, this technique shall require special solutions to be extended to on-wafer devices up to millimetre waves. The paper presents an overview on the traditional load pull measurement techniques focusing the attention on millimetre wave application. An example of a fully automatic on-wafer system is described along with the more useful calibration techniques. By means of this test set a very detailed characterisation of devices can be carried out in short time, by setting the loads either at the fundamental or at the harmonic frequencies with independent controls.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2497919
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