In this contribution a novel stochastic Galerkin method is proposed to analyze the parameter variability of uniform on-chip interconnects. This efficient and accurate stochastic modeling method is made possible, specifically for on-chip interconnects, by first constructing parameterized macromodels of the per unit length transmission line parameters. The theory is illustrated by means of a numerical example, i.e. an inverted embedded microstrip line, of which the variability is analyzed in both the frequency and the time domain. A comparison with a standard Monte Carlo technique validates the new approach.
Frequency and Time Domain Variability Analysis of an On-Chip Inverted Embedded Microstrip Line Using a Macromodeling-based Stochastic Galerkin Method / Vande Ginste, D.; De Zutter, D.; Deschrijver, D.; Dhaene, T.; Manfredi, Paolo; Canavero, Flavio. - STAMPA. - (2012), pp. 85-88. (Intervento presentato al convegno IEEE 16th Workshop on Signal and Power Integrity (SPI) tenutosi a Sorrento (Italy) nel May 13-16) [10.1109/SaPIW.2012.6222917].
Frequency and Time Domain Variability Analysis of an On-Chip Inverted Embedded Microstrip Line Using a Macromodeling-based Stochastic Galerkin Method
MANFREDI, PAOLO;CANAVERO, Flavio
2012
Abstract
In this contribution a novel stochastic Galerkin method is proposed to analyze the parameter variability of uniform on-chip interconnects. This efficient and accurate stochastic modeling method is made possible, specifically for on-chip interconnects, by first constructing parameterized macromodels of the per unit length transmission line parameters. The theory is illustrated by means of a numerical example, i.e. an inverted embedded microstrip line, of which the variability is analyzed in both the frequency and the time domain. A comparison with a standard Monte Carlo technique validates the new approach.Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2498520
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo