Archivio Istituzionale della RicercaIn this paper the susceptibility of integrated bandgap voltage references to Radio Frequency Interference (RFI) is investigated by on-chip measurements carried out on Kuijk and Tsividis bandgap circuits. These measurements highlight the offset in the reference voltage induced by continuous wave RFI and the complete failures which may be experienced by bandgap circuits. The role of the susceptibility of the startup circuit and of the operational amplifier which are included in such circuits is also focused
Investigation on RFI effects in bandgap voltage references / Fiori, Franco; Crovetti, Paolo Stefano. - In: MICROELECTRONICS JOURNAL. - ISSN 0959-8324. - STAMPA. - 35:6(2004), pp. 557-561. [10.1016/j.mejo.2003.11.002]
Investigation on RFI effects in bandgap voltage references
FIORI, Franco;CROVETTI, Paolo Stefano
2004
Abstract
In this paper the susceptibility of integrated bandgap voltage references to Radio Frequency Interference (RFI) is investigated by on-chip measurements carried out on Kuijk and Tsividis bandgap circuits. These measurements highlight the offset in the reference voltage induced by continuous wave RFI and the complete failures which may be experienced by bandgap circuits. The role of the susceptibility of the startup circuit and of the operational amplifier which are included in such circuits is also focused
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https://hdl.handle.net/11583/2517737
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