Impact of Journals and Academic Reputations of Authors: A Structured Bibliometric Survey of the IEEE Publication Galaxy

Tipo di pubblicazione: Articolo su rivista
Tipologia MIUR: Contributo su Rivista > Articolo in rivista
Titolo: Impact of Journals and Academic Reputations of Authors: A Structured Bibliometric Survey of the IEEE Publication Galaxy
Autori: Canavero F.G.; Franceschini F.; Maisano D.; Mastrogiacomo L.
Autori di ateneo:
Titolo del periodico: IEEE TRANSACTIONS ON PROFESSIONAL COMMUNICATION
Tipo di referee: Esperti anonimi
Editore: IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
Volume: 57
Numero: 1
Intervallo pagine: pp. 17-40
Numero di pagine: 24
ISSN: 0361-1434
Abstract: Research problem: This study explores the use of bibliometric indicators to objectively evaluate IEEE scientific journals from two different perspectives: (1) journal impact and diffusion and (2) the academic reputation of journal authors. Research questions: (1) Which journals are better at selecting articles with high scientific impact (measured by average citations per article), and publishing authors with strong reputations (measured by $h$-indices)? (2) Does the impact of journal articles correlate positively with the reputations of their authors? and (3) Can bibliometric indicators provide a simple way for journal editors to monitor journal performance in a manner complementary to traditional ISI impact factor (IF)? Literature review: This paper reviews literature on citation analysis, a bibliometric method of measuring impact based on the number of times a work is cited, and explains such bibliometric indicators as ${rm CPP}$ , Hirsch index, and IF which measure the impact of a journal, and introduces a new indicator called $h$ -spectrum to objectively measure the reputation of a journal's author group. Methodology: This quantitative study performed citation analysis on 250,000 authors in 110 IEEE journals using citation statistics from the Google Scholar, Web of Science, and Scopus databases to construct the $h$ -spectrum indicator. The authors used automated filtering techniques to exclude questionable author data. Results and conclusions: The first phase of analysis indicated significant differences among IEEE publications in journal impact, and found that the $h$-index and ${rm- CPP}$ were suitable for evaluating journals except in their most recent five years where annual rankings are proposed instead. The second phase of analysis found that $h$-spectra distributions of author reputation differ among journals in a single year, and are generally stable for a single journal over five years. Maps were constructed to locate journals graphically based on the complementary indicators of impact and reputation, and to show changes in impact and reputation over time. The maps indicated that journals with high impact tend to have authors with high reputations but the opposite is not necessarily true. Suggestions were made to explain different combinations of high and low impact and reputation for journals. The use of maps complements IF and provides a simple tool to monitor journal reputation at the time of most recent publication. The study is limited by assumptions about the value of citations, the reliability of search engine statistics, and the homogeneity of IEEE journal citation practices, as well as the failure to account for coauthors, article age, and authors who publish multiple times per year in the same journal. Future research could examine non-IEEE journals and normalize subfields within IEEE journals to avoid favoring fields that use more citations
Data: 2014
Status: Pubblicato
Lingua della pubblicazione: Inglese
Parole chiave: hirsch-index, hirsch spectrum, citations, bibliometrics, impact factor, journal authors
Dipartimenti (originale): DET - Dipartimento di Elettronica e Telecomunicazioni
DIGEP - Dipartimento di Ingegneria Gestionale e della Produzione
Dipartimenti: DIGEP - Dipartimento di Ingegneria Gestionale e della Produzione
DET - Dipartimento di Elettronica e Telecomunicazioni
URL correlate:
Area disciplinare: Area 09 - Ingegneria industriale e dell'informazione > TECNOLOGIE E SISTEMI DI LAVORAZIONE
Area 09 - Ingegneria industriale e dell'informazione > ELETTROTECNICA
Data di deposito: 29 Ott 2013 11:08
Data ultima modifica (IRIS): 29 Apr 2016 10:20:41
Data inserimento (PORTO): 01 Mag 2016 03:36
Numero Identificativo (DOI): 10.1109/TPC.2013.2255935
Permalink: http://porto.polito.it/id/eprint/2518646
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Citazioni:

Il campo presenta il numero di citazioni presenti sulle banche dati Scopus e Web of Science e permette di accedere ai relativi record. Visualizza inoltre il link al record presente su Google Scholar.

Possono verificarsi discrepanze rispetto ai dati presenti sulle banche dati per i seguenti motivi:

  • Differenze tra i dati riportati su IRIS e quelli presenti nelle banche dati.
  • Il numero di citazioni riportate su PORTO viene estratto mensilmente. Il dato citazionale presente sulle singole banche dati è aggiornato in tempo reale
  • Il numero di citazioni per WoS viene calcolato sulla base delle collezioni in abbonamento (Science citation index Expanded e Conference Proceedings Citation Index)

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