Archivio Istituzionale della RicercaIn-field testing of SoC devices is increasingly important to face the dependability requirements of several application domains. Different solutions can be devised and adopted. We summarize the main solutions currently adopted by industry, identify the most critical open issues, and discuss important future trends.
In-field testing of SoC devices: Which solutions by which players? / Jacob A., Abraham; Xinli, Gu; Teresa, Maclaurin; Janusz, Rajski; Paul G., Ryan; Dimitris, Gizopoulos; SONZA REORDA, Matteo. - STAMPA. - (2014). (Intervento presentato al convegno 2014 IEEE 32nd VLSI Test Symposium (VTS)) [10.1109/VTS.2014.6818780].
In-field testing of SoC devices: Which solutions by which players?
SONZA REORDA, Matteo
2014
Abstract
In-field testing of SoC devices is increasingly important to face the dependability requirements of several application domains. Different solutions can be devised and adopted. We summarize the main solutions currently adopted by industry, identify the most critical open issues, and discuss important future trends.
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https://hdl.handle.net/11583/2544957
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