Archivio Istituzionale della RicercaThis survey introduces into the common practices, current challenges and advanced techniques of high quality system level test and diagnosis. Specialized techniques and industrial standards of testing complex boards are introduced. The reuse for system test of design for test structures and test data developed at chip level is discussed, including the limitations and research challenges. Structural test methods have to be complemented by functional test methods. State-of-the-art and leading edge research for functional testing will be covered.
High Quality System Level Test and Diagnosis / Artur, Jutman; SONZA REORDA, Matteo; Hans Joachim, Wunderlich. - STAMPA. - (2014), pp. 298-305. (Intervento presentato al convegno 2014 IEEE 23rd Asian Test Symposium tenutosi a Hangzhou, China nel November 2014) [10.1109/ATS.2014.62].
High Quality System Level Test and Diagnosis
SONZA REORDA, Matteo;
2014
Abstract
This survey introduces into the common practices, current challenges and advanced techniques of high quality system level test and diagnosis. Specialized techniques and industrial standards of testing complex boards are introduced. The reuse for system test of design for test structures and test data developed at chip level is discussed, including the limitations and research challenges. Structural test methods have to be complemented by functional test methods. State-of-the-art and leading edge research for functional testing will be covered.
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https://hdl.handle.net/11583/2580159
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