This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and “black-box” approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the “stochastic testing” method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted.

Efficient Statistical Simulation of Microwave Devices Via Stochastic Testing-Based Circuit Equivalents of Nonlinear Components / Manfredi, Paolo; Canavero, Flavio. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 63:5(2015), pp. 1502-1511. [10.1109/TMTT.2015.2417855]

Efficient Statistical Simulation of Microwave Devices Via Stochastic Testing-Based Circuit Equivalents of Nonlinear Components

Manfredi, Paolo;CANAVERO, Flavio
2015

Abstract

This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and “black-box” approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the “stochastic testing” method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2647382