The vulnerability of microcontroller system against high-altitude electromagnetic pulse (HEMP) is taken as an illustration to demonstrate the assessment methodology based on Bayesian networks (BN). The complete procedure is performed by two steps: the qualitative and the quantitative. The first step focuses on the analysis of three classes of properties, the electromagnetic environment, system function/structure, and their interactions. The primary BN model is built at the end of the first step. The second step investigates the BN nodes and branches one by one, which further implemented through two stages, i.e., the data acquisition and data fusion. The susceptibilities of devises are examined with the pulsed current injection. The responses of the transmission lines to HEMP are computed using the field-line coupling model. Comparing the probability density functions of the electromagnetic stresses and strengths produces the failure probabilities of the interface components. Through two-step analysis, the critical elements and coupling paths are identified and highlighted. After neglecting those unimportant factors, many BN nodes and branches are deleted. Thus, the complexity of assessment is reduced. By assigning the probability values to the simplified BN model, the system failure probability is calculated, which characterizes the system vulnerability against HEMP environment. The illustration validates the rationality and flexibility of the BN assessment methodology.

System-Level Vulnerability Assessment for EME: From Fault Tree Analysis to Bayesian Networks—Part II: Illustration to Microcontroller System / Mao, Congguang; Canavero, Flavio; Cui, Zhitong; Sun, Dongyuang. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 58:1(2016), pp. 188-196. [10.1109/TEMC.2015.2502591]

System-Level Vulnerability Assessment for EME: From Fault Tree Analysis to Bayesian Networks—Part II: Illustration to Microcontroller System

CANAVERO, Flavio;
2016

Abstract

The vulnerability of microcontroller system against high-altitude electromagnetic pulse (HEMP) is taken as an illustration to demonstrate the assessment methodology based on Bayesian networks (BN). The complete procedure is performed by two steps: the qualitative and the quantitative. The first step focuses on the analysis of three classes of properties, the electromagnetic environment, system function/structure, and their interactions. The primary BN model is built at the end of the first step. The second step investigates the BN nodes and branches one by one, which further implemented through two stages, i.e., the data acquisition and data fusion. The susceptibilities of devises are examined with the pulsed current injection. The responses of the transmission lines to HEMP are computed using the field-line coupling model. Comparing the probability density functions of the electromagnetic stresses and strengths produces the failure probabilities of the interface components. Through two-step analysis, the critical elements and coupling paths are identified and highlighted. After neglecting those unimportant factors, many BN nodes and branches are deleted. Thus, the complexity of assessment is reduced. By assigning the probability values to the simplified BN model, the system failure probability is calculated, which characterizes the system vulnerability against HEMP environment. The illustration validates the rationality and flexibility of the BN assessment methodology.
File in questo prodotto:
File Dimensione Formato  
jnl-2016-TEMC_Vulnerability-II_cm+fc+zc+ds.pdf

non disponibili

Descrizione: jnl-2016-TEMC_Vulnerability-II_cm+fc+zc+ds.pdf
Tipologia: 2a Post-print versione editoriale / Version of Record
Licenza: Non Pubblico - Accesso privato/ristretto
Dimensione 1.16 MB
Formato Adobe PDF
1.16 MB Adobe PDF   Visualizza/Apri   Richiedi una copia
jnl-2016-TEMC_Vulnerability-II_cm+fc+zc+ds_OA.pdf

accesso aperto

Descrizione: jnl-2016-TEMC_Vulnerability-II_cm+fc+zc+ds_OA.
Tipologia: 2. Post-print / Author's Accepted Manuscript
Licenza: PUBBLICO - Tutti i diritti riservati
Dimensione 1.26 MB
Formato Adobe PDF
1.26 MB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2647383
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo