A comprehensive technique for the assessment of microwave circuit design variability through physical simulations

We propose a numerically efficient technique for the mixed-mode physics-based variability analysis of microwave circuits undergoing concurrent variations in the active device and in the external passive network, allowing for a direct link between the spread of nonlinear circuit performances and the variability of technological parameters. The new technique has been validated against repeated physical load-pull simulations of a class AB power amplifier with random variations of the active device gate length and of the external load, showing an excellent precision and a massive reduction of simulation time.