This paper addresses the stochastic simulation of high-speed optical interconnects. It provides an effective solution for the inclusion of the effects of process variation or possible unknown device characteristics on the system response. The proposed approach is based on the stochastic collocation method and Lagrange interpolation. The results obtained on the transient analysis of a realistic on-board optical link with uncertain parameters conclude the paper.

A Statistical Assessment of Opto-Electronic Links / Manfredi, Paolo; Stievano, IGOR SIMONE; Perrone, Guido; Bardella, Paolo; Canavero, Flavio. - STAMPA. - (2012), pp. 61-64. (Intervento presentato al convegno 21st IEEE International Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) tenutosi a Tempe, AZ, USA nel Oct. 21 -24) [10.1109/EPEPS.2012.6457843].

A Statistical Assessment of Opto-Electronic Links

MANFREDI, PAOLO;STIEVANO, IGOR SIMONE;PERRONE, Guido;BARDELLA, PAOLO;CANAVERO, Flavio
2012

Abstract

This paper addresses the stochastic simulation of high-speed optical interconnects. It provides an effective solution for the inclusion of the effects of process variation or possible unknown device characteristics on the system response. The proposed approach is based on the stochastic collocation method and Lagrange interpolation. The results obtained on the transient analysis of a realistic on-board optical link with uncertain parameters conclude the paper.
2012
9781467325370
9781467325394
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2505648
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