Variability analysis of interconnects terminated by polynomial nonlinear loads

In this paper, a stochastic modeling method is presented for the analysis of variability effects, induced by the manufacturing process, on interconnect structures terminated by polynomial nonlinear loads. The technique is based on the solution of the pertinent stochastic Telegrapher's equations in time domain by means of the so-called stochastic Galerkin method in conjunction with a finite-difference time-domain technique, allowing the inclusion of, e.g., nonlinear capacitors at the terminals of the lines. The proposed technique is validated and illustrated with an example, demonstrating its accuracy and efficiency.