The transient simulation of electrically-long low-loss multiconductor interconnects is considered from a practical point of view. The importance of frequency dependent losses in these interconnects is discussed and a simple transmission line characterization procedure allowing for such losses is proposed. The characterization obtained yields simple and efficient interconnect models, that the user can include, without programming, in any simulator accepting differential operators

Transient simulation of lossy multiconductor interconnects / Canavero, Flavio; Maio, Ivano Adolfo. - STAMPA. - (1997), pp. 243-246. (Intervento presentato al convegno 1997 International Symposium on Electromagnetic Compatibility tenutosi a Bejing (China) nel May 21-23) [10.1109/ELMAGC.1997.617133].

Transient simulation of lossy multiconductor interconnects

CANAVERO, Flavio;MAIO, Ivano Adolfo
1997

Abstract

The transient simulation of electrically-long low-loss multiconductor interconnects is considered from a practical point of view. The importance of frequency dependent losses in these interconnects is discussed and a simple transmission line characterization procedure allowing for such losses is proposed. The characterization obtained yields simple and efficient interconnect models, that the user can include, without programming, in any simulator accepting differential operators
1997
0780336089
File in questo prodotto:
File Dimensione Formato  
cnf-1997-emc-lossy-IEEE.pdf

accesso aperto

Tipologia: 2. Post-print / Author's Accepted Manuscript
Licenza: PUBBLICO - Tutti i diritti riservati
Dimensione 393.9 kB
Formato Adobe PDF
393.9 kB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2499828
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo