Archivio Istituzionale della RicercaThe authors describe a microwave test set that can be automatically reconfigured to perform linear and nonlinear characterization. Particular attention was devoted to speeding up the load pull contour tracking process. The test set measures S-parameters, power levels, gains, and harmonics up to 26 GHz. The software can set different loads randomly or by a special algorithm which automatically tracks power, gain, or efficiency contours. The test set was used to fully characterize several MESFETs up to 20 GHz. The system can be computer or manually driven and is particularly oriented to production tests.
Small and large signal device characterization made easier and faster with an integrated test system / Ferrero, ANDREA PIERENRICO; Pisani, Umberto; F., Sanpietro. - (1993), pp. 6-9. (Intervento presentato al convegno IEEE Instrumentation and Measurement Technology Conference tenutosi a Irvine, CA (USA) nel 18-20 May 1993) [10.1109/IMTC.1993.382691].
Small and large signal device characterization made easier and faster with an integrated test system
FERRERO, ANDREA PIERENRICO;PISANI, Umberto;
1993
Abstract
The authors describe a microwave test set that can be automatically reconfigured to perform linear and nonlinear characterization. Particular attention was devoted to speeding up the load pull contour tracking process. The test set measures S-parameters, power levels, gains, and harmonics up to 26 GHz. The software can set different loads randomly or by a special algorithm which automatically tracks power, gain, or efficiency contours. The test set was used to fully characterize several MESFETs up to 20 GHz. The system can be computer or manually driven and is particularly oriented to production tests.
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https://hdl.handle.net/11583/1416380
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