An Enhanced Framework for Microprocessor Test-Program Generation

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Item Type: Proceeding
MIUR type: Proceedings > Proceedings
Title: An Enhanced Framework for Microprocessor Test-Program Generation
Authors string: F. Corno; Squillero G.
University authors:
Page Range: pp. 307-315
Referee type: Not specified type
ISSN: 0302-9743
Volume: 2610
Event Title: 6th European Conference, EuroGP 2003
Event Location: Essex (UK)
Event Dates: April 14–16, 2003
Abstract: Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to give information about the machine that actually executes them. Today, the need for effective test programs is increasing, and, due to the inexorable increase in the number of transistor that can be integrated onto a single silicon die, devising effective test programs is getting more problematical. This paper presents μGP, an efficient and versatile approach to testprogram generation based on an evolutionary algorithm. The proposed methodology is highly versatile and improves previous approaches, allowing the testprogram generator generating complex assembly programs that include subroutines calls
Date: 2003
Status: Published
Language of publication:
Uncontrolled Keywords:
Departments (original): DAUIN - Control and Computer Engineering
Departments: DAUIN - Department of Control and Computer Engineering
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    Subjects: Area 09 - Ingegneria industriale e dell'informazione > SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI
    Date Deposited: 05 Oct 2006 14:38
    Last modification data (IRIS): 09 Jul 2014 09:21:25
    Update date (PORTO): 24 Oct 2014 09:19
    Id Number (DOI): 10.1007/3-540-36599-0_28
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