Archivio Istituzionale della RicercaAmong the different types of algorithms proposed to test static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. A large number of march tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of fault, making a key hurdle the generation of new march tests. The aim of this paper is to target the whole set of realistic fault model and to provide a unique march test able to reduce the test complexity of 15.4% than state-of-the-art march algorithm
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - STAMPA. - (2006), pp. 155-156. (Intervento presentato al convegno IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Prague, CZ nel 18-21 Apr. 2006) [10.1109/DDECS.2006.1649602].
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs
BENSO, Alfredo;BOSIO, ALBERTO;DI CARLO, STEFANO;DI NATALE, Giorgio;PRINETTO, Paolo Ernesto
2006
Abstract
Among the different types of algorithms proposed to test static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. A large number of march tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of fault, making a key hurdle the generation of new march tests. The aim of this paper is to target the whole set of realistic fault model and to provide a unique march test able to reduce the test complexity of 15.4% than state-of-the-art march algorithm
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https://hdl.handle.net/11583/1499963
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