Archivio Istituzionale della RicercaThis work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADC's. Simulation results showed a detection sensitivity on specifications parameters of up to −100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.
Fully digital strategy for fast calibration and test of Sigma Delta ADC's / D., DE VENUTO; Reyneri, Leonardo. - In: MICROELECTRONICS JOURNAL. - ISSN 0959-8324. - 38:1(2007), pp. 140-147. [10.1016/j.mejo.2006.08.002]
Fully digital strategy for fast calibration and test of Sigma Delta ADC's
REYNERI, Leonardo
2007
Abstract
This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADC's. Simulation results showed a detection sensitivity on specifications parameters of up to −100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.
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https://hdl.handle.net/11583/1613028
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