An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction

Item Type: Proceeding
MIUR type: Proceedings > Proceedings
Title: An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
Authors string: Ravotto D; Sanchez E.; Schillaci M; Squillero G
University authors:
Page Range: pp. 214-223
Journal or Publication Title: LECTURE NOTES IN COMPUTER SCIENCE
Referee type: Not specified type
ISBN: 9783540787600
ISSN: 0302-9743
Volume: 4974
Event Title: EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog
Event Location: Naples (ITA)
Event Dates: March 26-28, 2008
Abstract: Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodology based on an evolutionary tool which exploits high level metrics is presented. To strengthen the correlation between high-level coverage and the gate-level fault coverage, in the case of peripheral cores, the FSMs embedded in the system are identified and then dynamically extracted via simulation, while transition coverage is used as a measure of how much the system is exercised. The results obtained by the evolutionary tool outperform those obtained by a skilled engineer on the same benchmark
Date: 2008
Status: Published
Language of publication: English
Uncontrolled Keywords:
Departments (original): DAUIN - Control and Computer Engineering
Departments: DAUIN - Department of Control and Computer Engineering
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    Subjects: Area 09 - Ingegneria industriale e dell'informazione > SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI
    Date Deposited: 13 Jan 2009 05:01
    Last Modified: 10 Jul 2014 00:02
    Id Number (DOI): 10.1007/978-3-540-78761-7_22
    Permalink: http://porto.polito.it/id/eprint/1877304
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