The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space exploration and validation of test strategies and schedules using transaction level models (TLMs). Since many aspects of testing involve the transfer of a significant amount of test stimuli and responses, the communication-centric view of TLMs suits this purpose exceptionally well.

Test exploration and validation using transaction level models / Kochte, M. A; Zollen, C. G; Imhof, M. E; Khaligh, R. S; Radetzki, M.; Wunderlich, H. J; DI CARLO, Stefano; Prinetto, Paolo Ernesto. - STAMPA. - (2009), pp. 1250-1253. (Intervento presentato al convegno DATE '09 : Design, Automation & Test in Europe Conference & Exhibition, 2009 tenutosi a Nice, FR nel 20-24 Apr. 2009) [10.1109/DATE.2009.5090856].

Test exploration and validation using transaction level models

DI CARLO, STEFANO;PRINETTO, Paolo Ernesto
2009

Abstract

The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space exploration and validation of test strategies and schedules using transaction level models (TLMs). Since many aspects of testing involve the transfer of a significant amount of test stimuli and responses, the communication-centric view of TLMs suits this purpose exceptionally well.
2009
9781424437818
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2281242
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